Floating gate memory cells in vertical memory

ABSTRACT

Floating gate memory cells in vertical memory. A control gate is formed between a first tier of dielectric material and a second tier of dielectric material. A floating gate is formed between the first tier of dielectric material and the second tier of dielectric material, wherein the floating gate includes a protrusion extending towards the control gate. A charge blocking structure is formed between the floating gate and the control gate, wherein at least a portion of the charge blocking structure wraps around the protrusion.

BACKGROUND

Semiconductor memory devices that are used for storing data cangenerally be divided into two classes: volatile memory devices andnon-volatile memory devices. Volatile memory devices lose data storedtherein when the power supply is interrupted. In contrast, non-volatilememory devices retain the stored data even when the power supply isinterrupted. Therefore, nonvolatile memory devices, such as flash memorydevices, are widely used in applications where power may be interrupted.For example, power may not be available. Power may occasionally beinterrupted or a lower power consumption may be dictated, e.g., in amobile phone system, a memory card for storing music and/or movie data.With increasing process capability and miniaturization, there is anincreased demand for memory cells of a smaller size, even in the flashmemory device.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings, which are not necessarily drawn to scale, like numeralsmay describe similar components in different views. Like numerals havingdifferent letter suffixes may represent different instances of similarcomponents. The drawings illustrate generally, by way of example, butnot by way of limitation, various embodiments discussed in the presentdocument.

FIG. 1 illustrates an example of vertical strings of memory cells in a3D NAND array architecture;

FIGS. 2A-P illustrate a technique of making a vertical NAND memoryaccording to an embodiment;

FIGS. 3A-D illustrate another technique of making a vertical NAND memoryaccording to an embodiment;

FIGS. 4A-H shows one alternative process to reduce or eliminate chargeleakage according to an embodiment;

FIGS. 5A-H shows a second alternative process to reduce or eliminatecharge leakage according to an embodiment;

FIGS. 6A-C illustrates three additional vertical memories embodiments;

FIGS. 7A-F illustrate fabrication of a vertical memory as shown in FIG.6A according to an embodiment;

FIG. 8 illustrates a vertical memory as shown in FIG. 6B according to anembodiment;

FIGS. 9A-D illustrate fabrication of a vertical memory as shown in FIG.6C according to an embodiment; and

FIGS. 10A-F illustrate fabrication of a vertical memory as shown in FIG.6C according to some embodiments.

DESCRIPTION OF EMBODIMENTS

FIG. 1 illustrates an example of a vertical memory 100 that includesvertical strings of memory cells in a 3D NAND (Not And) architecture,according to what the inventors consider to be a prior internalembodiment. The vertical memory 100 includes a stack of memory cells 110that includes floating gates (FGs) 102, charge blocking structures(e.g., IPD 104), control gates (CGs) 106, and tiers of dielectricmaterial (e.g., oxide layers 108). In the illustrated example, IPD 104is disposed between each floating gate (FG) 102 and control gate (CG)106. Charge can get trapped on portions of the IPD 104, such as onportions of the IPD 104 that laterally extend between a FG 102 andrespective tiers of dielectric material. As shown in FIG. 1, the lengthof a FG 102, i.e., L₁, is approximately half of the length of arespective CG 106, i.e., L₂. In one embodiment, for example, the lengthof a FG 102 in the direction of current flow (e.g., in a pillar of astring of the memory cells) is approximately 15 nm compared to thelength of a respective CG 106 of approximately 30 nm.

For example, in an embodiment where the IPD 104 of a given memory cellis ONO (oxide-nitride-oxide), the nitride may undesirably trap charge ina first substantially horizontal portion 122 of the nitride and/or in asecond substantially horizontal portion 120 of the nitride. Accordingly,embodiments of the present disclosure pare back the IPD 104 (e.g., thenitride of an ONO charge blocking structure) in those areas and/orincrease the length of a FG 102 relative to a respective CG 106.Embodiments presented herein include those where, for example, the IPD104 in a memory cell is recessed and a second floating gate material(e.g., FG2 poly) (not shown in FIG. 1) is used to backfill the recess.For example, in some embodiments, the IPD 104 is mostly recessed fromthe top and bottom of each of the FGs 102, either by dry, vapor or wetetch, or a combination thereof. Instead of a dielectric deposition, suchas an oxide layer deposition, the resulting volume of the recess isinstead filled with conductive material to increase the size of each ofthe FGs 102. For example, in certain embodiments, the length of a FG 102in the direction of the channel current flow is substantially equal tothe length of the respective CG 106 (e.g., as opposed to the length ofthe FG 102 being equal to the length of the CG 106 minus two times thethickness of the IPD 104, e.g., a nitric oxide (NO) or ONO). Forexample, the length of the FG 102 and CG 106 may be approximately 30 nm.In at least some of the embodiments, a first (e.g., original) floatinggate material (e.g., FG1 poly) is selectively removed and a second layerof oxide of the IPD 104 is formed, and then a second floating gatematerial (e.g., FG2 poly) is deposited and used to form the FGs 102.

FIGS. 2A-P illustrate a technique of making a vertical NAND memoryaccording to an embodiment. FIG. 2A is a cross-sectional view of a stackof materials 200 including alternating tiers of dielectric material(e.g., oxide layers 240) and control gate material (e.g., tiers ofconductive materials, such as doped polysilicon layers 242). FIG. 2B isa perspective view of the stack of materials 200 shown in FIG. 2A. InFIGS. 2A and 2B, the oxide layers 240 and doped polysilicon layers 242have been etched to form openings extending therethrough, wherein theopenings include first recesses 246 adjacent to the doped polysiliconlayers 242. Bottom layer 244 is an etch stop layer, such as AlO_(x).

FIG. 2C is a cross-sectional view of the stack of materials 200 after afirst layer (e.g., a first oxide layer 248) of a charge blockingstructure is formed (e.g., grown) in each of the recesses 246 adjacentto a respective one of doped polysilicon layers 242.

FIG. 2D is a cross-sectional view of the stack of materials 200 after asecond layer 250 (e.g., a nitride layer 250) of a charge blockingstructure (which in some embodiments comprises a barrier film) is formedin each of the recesses 246 adjacent to the first oxide layer 248 andadjacent to exposed surfaces of the oxide layers 240 in the openings.The second layer has an inner surface 252. FIG. 2E is a perspective viewof the stack of materials 200 shown in FIG. 2D.

FIG. 2F is a cross-sectional view of the stack of materials 200 after athird layer (e.g., a second oxide layer 256) of a charge blockingstructure is formed adjacent to the nitride layer 250 in the openings,wherein each of the openings thereafter include second recesses 258corresponding to the first recesses 246.

FIG. 2G is a cross-sectional view of the stack of materials 200 after afirst floating gate (FG1) material (e.g., first polysilicon) is formedin the second recesses 258. For example, in at least some embodiments,the first polysilicon may be deposited in the openings and etched backto recess the first polysilicon in each of the second recesses 258,thereby forming first FG1s 260 with inner surfaces 262. In otherembodiments, the first polysilicon may be oxidized, and then the oxideremoved to form the first FG1s 260. FIG. 2H is a perspective view of thestack of materials 200 shown in FIG. 2G.

FIG. 2I is a cross-sectional view of the stack of materials 200 after anisotropic etch of the second oxide layer 256 in each of the openings torecess an inner surface 264 of the second oxide layer 256 in each of theopenings from the inner surface 262 of the respective first FG1 260. Theetch may be a wet etch, a vapor etch or a dry etch, and may be selectiveto nitride to leave the nitride layer 250 in each of the openings. Forexample, the second oxide layer 256 may be etched using a dilutehydrogen fluoride (HF) vapor etch.

FIG. 2J is a cross-sectional view of the stack of materials 200 after anisotropic etch of the nitride layer 250 in each of the openings torecess the nitride layer 250 to a depth beyond an inner surface 264 ofthe second oxide layer 256 in each of the openings. Phosphoric acid canbe used as an etchant for the nitride layer 250, which is selective topolysilicon and oxide.

FIG. 2K is a cross-sectional view of the stack of materials 200 after asecond floating gate (FG2) material (e.g., second polysilicon 266) isformed in the openings. The second polysilicon 266 may be of the samecomposition as, or may be of a different composition than, the firstpolysilicon. The second polysilicon 266 may be deposited using an atomiclayer deposition (ALD) technique, such that the deposited polysilicon266 is highly conformal. In at least some embodiments, the secondpolysilicon 266 may be implanted with dopants. For example,plasma-doping or other highly conformal doping techniques may be used.In addition, a film deposition and removal technique may be used toremove the deposited film since the wafer is completely covered withpolysilicon.

FIGS. 2L-N are cross-sectional views of the stack of materials 200 afterthe second polysilicon 266 has been etched back in the openings, withFIGS. 2L, 2M and 2N each showing different alternatives for theresulting structure depending on, for example, slight differences in thetiming of the etch back. In each of the structures shown in FIGS. 2L-2N,the second polysilicon 266 is etched back in the openings until innersurfaces 268 of the second polysilicon 266 are substantially co-planarwith inner surfaces 270 of the oxide layers 240 in the openings. Acombination of a first FG1 260 and the etched back second polysilicon266 (FG2) can collectively form a floating gate, FG, having a protrusion(e.g., corresponding to the first FG1 260) extending towards a controlgate, CG.

Accordingly, as shown in FIG. 2N, a memory cell can thus be formed thatincludes a FG between and in contact with an upper surface of a firsttier of dielectric material and a lower surface of a second tier ofdielectric material. The FG includes a protrusion extending towards a CGthat has also been formed between the upper surface of the first tier ofdielectric material and the lower surface of the second tier ofdielectric material. A charge blocking structure (e.g., the abovedescribed ONO structure) is between the FG and the CG.

The charge blocking structure includes a barrier film, such as a layerof nitride. A substantially vertical portion of the barrier film isbetween the CG and the FG. A first substantially horizontal portion ofthe barrier film laterally extends partially between the first tier ofdielectric material and the FG. Likewise, a second substantiallyhorizontal portion of the barrier film laterally extends partiallybetween the second tier of dielectric material and the FG. For example,in the embodiment illustrated in FIG. 2N, a first substantiallyhorizontal portion of the barrier film laterally extends to a point suchthat it is between the protrusion and the first tier of dielectricmaterial, but is not between another portion of the FG and the firsttier of dielectric material. In other words, for the other portion ofthe FG, there is no barrier film between the FG and the first tier ofdielectric material.

In the embodiment illustrated in FIG. 2N, at least a portion of thecharge blocking structure wraps around at least a portion of theprotrusion. For example, a second layer of oxide 256 can wrap around theprotrusion. A first portion of the layer of nitride 250 (e.g., the firstsubstantially horizontal portion referred to in the prior paragraph) anda first portion of the second layer of oxide 256 are between theprotrusion and an upper surface of the first tier of dielectric material(and are both in contact with the FG. A second portion of the layer ofnitride 250 (e.g., the second substantially horizontal portion referredto in the prior paragraph) and a second portion of the second layer ofoxide 256 are between the protrusion and a lower surface of the secondtier of dielectric material (and are both in contact in with the FG).

In more particular detail, the embodiment shown in FIG. 2N shows a FGthat includes three protrusions extending towards a CG: a firstprotrusion adjacent to the upper surface of the first tier of dielectricmaterial, a second protrusion adjacent to the lower surface of thesecond tier of dielectric material, and a middle protrusion (e.g.,corresponding to the first FG1 260) between the first and secondprotrusions. As shown in FIG. 2N, in such an embodiment, the firstportion of the second layer of oxide 256 can be between the first andmiddle protrusions, and the second portion of the second layer of oxide256 can be between the second and middle protrusions.

Thus, a vertical string of memory cells 200 are shown having a memorycell that a control gate 242 between tiers of dielectric material 240(oxide layers) a floating gate 260/266 between the tiers of dielectricmaterial 240, wherein the floating gate 260/266 includes a protrusion269 extending towards the control gate 242, and a charge blockingstructure (layers 248, 250, 256) between the floating gate 260/266 andthe control gate, wherein at least a portion of the charge blockingstructure wraps around the protrusion.

The charge blocking structure includes a first layer of oxide 248, alayer of nitride 250 and a second layer of oxide 256, and the chargeblocking structure (layers 248, 250, 256) includes a barrier structure(e.g., the second layer of oxide) that wraps around the protrusion 269.A layer of the nitride layer 250 and portions of the second layer ofoxide 256 are disposed between the protrusion 269 and a dielectricmaterial 240. The floating gate 266 is in contact with the layer ofnitride 250 and the second layer of oxide 256.

Floating gate portion 266 is adjacent to a tier of the dielectricmaterial 240 and, wherein a horizontal portion of the second oxide layer256 is disposed between protrusion 269 and floating gate portion 266.Floating gate portion 266 contacts a tier of the dielectric material240. A barrier film of the charge blocking structure, e.g., at least oneof layers 248, 250, 256, has a substantially vertical portion disposedbetween the control gate 242 and the floating gate 260/266 and a firstsubstantially horizontal portion laterally extending partially between atier of dielectric material 240 and a portion of floating gate 260. Thebarrier film may be the nitride layer 250. Protrusion 269 is separatedfrom a tier of dielectric material 240 by at least a horizontal portionof the barrier film 250 and the second oxide layer 256.

The second layer of oxide 256 include substantially horizontal portions257 and a substantially vertical portion 259, wherein a thickness of thesubstantially vertical portion 259 of the second layer of oxide 256 andthe thickness of the horizontal portions 257 of the second layer ofoxide 256 are substantially the same. A first portion of the floatinggate 260 is separated from the first tier of dielectric material 240 bya substantially horizontal portion of the barrier film 250 and secondlayer of oxide 256.

FIG. 2O is a cross-sectional view 228 of the stack of materials 200 (asshown in the embodiment depicted in FIG. 2N) after a tunnel dielectricmaterial (e.g., tunnel oxide layer 280) is formed (e.g., grown) over theexposed surfaces of the first FG1 260 and the etched back secondpolysilicon 266 in the openings.

FIG. 2P is a perspective view of the stack of materials 200 shown inFIG. 2O. Relative to a memory cell in the structure shown in FIG. 1, anytop and/or bottom parasitic SONOS devices (relative to the memory cell)may be pared back and the length of the FG is substantially doubled,e.g., from approximately 15 nm to approximately 30 nm, so that thefloating gate is substantially the same length as the control gate.

FIGS. 3A-D illustrate another technique of making a vertical NAND memoryaccording to an embodiment. FIGS. 3A-D begin after the process shown inFIG. 2G.

FIG. 3A is a cross-sectional view of a stack of materials 300,corresponding to the stack of memory cells 200 shown in FIG. 2G, showingthe results of continuing the isotropic etch to further recess innersurfaces 362 of the first FG1s 360 into the first recesses (246).

FIG. 3B is a cross-sectional view of the stack of materials 300 afterthe second oxide layer 356 and nitride layer 350 have been etched backuntil exposed surfaces of the nitride layer 350 and the second oxidelayer 356 in the openings are substantially co-planar with the innersurfaces 362 of the first FG1s 360. In at least some embodiments, forexample, the second layer of oxide 356 may be etched selective tonitride, then the nitride layer 350 may be etched (e.g., usingphosphoric acid) selective to polysilicon and oxide. The etches may bewet etches, vapor etches or dry etches, or combinations thereof.

FIG. 3C is a cross-sectional view of the stack of materials 300 after asecond floating gate (FG2) material (e.g., second polysilicon 366) isformed in the openings and covering the length 311 of stack of materials300. The second polysilicon 366 may be of the same composition as, ormay be of a different composition than, the first polysilicon.

FIG. 3D is a cross-sectional view of the stack of materials 300 afterthe second polysilicon 366 has been etched back in the openings untilinner surfaces 368 of the second polysilicon 366 are substantiallyco-planar with inner surfaces 370 of the oxide layers 340. A combinationof a first FG1 360 and the etched back second polysilicon 366 (FG2) cancollectively form a floating gate, FG, having a protrusion (e.g.,corresponding to the first FG1 360) extending towards a control gate,CG. In contrast to the structure shown in FIG. 2N, in the structureshown in FIG. 3D, a FG has one protrusion extending towards the CG.

Thus, a vertical string of memory cells 300 are shown having a memorycell having a control gate 342 between tiers of dielectric material 340(oxide layers), a floating gate 360/366 between the tiers of dielectricmaterial 340, wherein the floating gate 360/366 includes a protrusion369 extending towards the control gate 342, and a charge blockingstructure (layers 348, 350, 356) between the floating gate 360/266 andthe control gate 342, wherein at least a portion of the charge blockingstructure (layers 348, 350, 356) wraps around the protrusion 369.

The charge blocking structure includes a first layer of oxide 348, alayer of nitride 350 and a second layer of oxide 356, and the chargeblocking structure (layers 348, 350, 356) includes a barrier structure(e.g., the second layer of oxide 356 and/or nitride layer 350) thatwraps around the protrusion 369. A layer of the nitride layer 350 andportions of the second layer of oxide 356 are disposed between theprotrusion 369 and a dielectric material 340.

The floating gate 366 is in contact with the layer of nitride 350 andthe second layer of oxide 356. Floating gate portion 366 contacts a tierof the dielectric material 340. Only protrusion 369 of floating gate360/266 extends toward the control gate 342. A barrier film of thecharge blocking structure, e.g., at least one of layers 348, 350, 356,has a substantially vertical portion disposed between the control gate342 and the floating gate 360/366 and a first substantially horizontalportion laterally extending partially between a tier of dielectricmaterial 340 and a portion of floating gate 360. The barrier film may bethe nitride layer 350.

Protrusion 369 is separated from a tier of dielectric material 340 by atleast a horizontal portion of the barrier film 350 and the second oxidelayer 356. The second layer of oxide 356 include first and secondsubstantially horizontal portions 357 and a substantially verticalportion 359, wherein a thickness of the substantially vertical portion359 of the second layer of oxide 356 and the thickness of the horizontalportions 357 of the second layer of oxide 356 are substantially thesame. A first portion of the floating gate 360 is separated from thefirst tier of dielectric material 340 by a substantially horizontalportion of the barrier film 350 and second layer of oxide 356.

In some cases, the structures illustrated in FIGS. 2A-P and FIGS. 3A-Dmay be susceptible to a potentially negative condition. For example, asshown in FIG. 3D, there is a thin oxide layer 348, nitride layer 350,and second oxide layer 356 separating the CG from the FG. At least aportion of the charge blocking structure wraps around at least a portionof the protrusion (e.g., nitride layer 350 and second layer of oxide 256wrap around protrusion formed by first FG1 360. A combination of a firstFG1 360 and the etched back second polysilicon 366 (FG2) cancollectively form a floating gate, FG, having a protrusion (e.g.,corresponding to the first FG1 360) extending towards a control gate,CG. However, even when the nitride layer 350 is relatively thick, chargeleakage may still occur.

FIGS. 4A-H and FIGS. 5A-G show two alternative processes that addressthe above condition. The processes illustrated by FIGS. 4A-G and FIGS.5A-G begin after a second layer 450, 550, respectively (e.g., a nitridelayer) of a charge blocking structure (which in some embodimentscomprises a barrier film) is formed in recesses adjacent to the firstoxide layer 448, 548, respectively, and adjacent to exposed surfaces ofthe oxide layers 440, 540, respectively.

FIG. 4A is a cross-sectional view of a stack of materials 400 includingalternating tiers of dielectric material (e.g., oxide layers 440) andcontrol gate material (e.g., tiers of conductive materials, such asdoped polysilicon layers 442). In FIG. 4A, a charge blocking structureis formed including a first oxide layer 448 formed substantiallyvertical over the recessed CG layer 442 and a second layer 450 (e.g., anitride layer), which in some embodiments comprises a barrier film)formed over the length of the full pillar 411. Unlike FIGS. 2A-F and 3A,the second oxidation step is not performed after deposition of thepillar nitride 450. The second layer 450 (e.g., a nitride layer) may beformed in each of the recesses 446 adjacent to the first oxide layer 448and adjacent to exposed surfaces of the oxide layers 440 in theopenings.

FIG. 4B is a perspective view of a stacked cell 400 showing theformation of the alternating oxide layers 440, control gate layer 442,first recess 446, first oxide layer 448 and the nitride layer 450. Firstoxide layer 448 and the nitride layer 450 are formed (e.g., grown) tocreate a charge blocking structure. In FIGS. 4A and 4B, openings,include first recesses 446 adjacent to the doped polysilicon layers 442,have been formed extending therethrough. Bottom layer 444 may be an etchstop layer, such as AlO_(x).

FIG. 4C is a cross-sectional view of the stack of materials 400 after afirst floating gate (FG1) material (e.g., first polysilicon) is formedin the first recesses 446 shown in FIGS. 4A-B. For example, in at leastsome embodiments, the first polysilicon 460 may be deposited in theopenings and etched back to recess the first polysilicon in each of thefirst recesses 446, thereby forming first FG1s 460 with inner surfaces462. The inner surface 462 of the first FG layer 460 may be etched evenwith the inner surface 452 of the second layer 450 (e.g., nitridelayer). Alternatively, any disposable layer with appropriate goodconformal deposition may be used.

FIG. 4D is a cross-sectional view of the stack of materials 400 afteretching the first FG layer 460 to recess the inner surface 462 of thefirst FG/disposable layer 460 beyond the inner surface 470 of the tieredoxide layer 440. An etchant selective to nitride may be used to etch thefirst FG/disposable layer 460.

FIG. 4E is a cross-sectional view of the stack of materials 400 after anisotropic etch of the nitride layer 450 in each of the openings isperformed to recess the nitride layer 450 to a depth beyond an innersurface 462 of the first FG/disposable layer 460 in each of theopenings. Phosphoric acid can be used as an etchant for the nitridelayer 450, which is selective to polysilicon and oxide.

FIG. 4F is a cross-sectional view of the stack of materials 400 afterremoval of the FG/disposable layer 460 via etching, e.g., wet, dry orvapor etching. A second recess 458 is left between the nitride layer 450and the tier oxide layer 440.

FIG. 4G is a cross-sectional view of the stack of materials 400 afterforming a second oxidation layer 456 to complete the ONO layer. FIG. 4Galso illustrates deposition of polysilicon over the length of the fullpillar 411 for the second FG layer 466. The polysilicon for the secondFG layer 466 may optionally be doped.

FIG. 4H is a cross-sectional view of the stack of materials 400 afterisolating the second FG layer 466 by etching or oxidation until innersurface 468 of the second FG layer 466 is substantially even with theinner surface 470 of the tiered oxide layer 440. An etchant selective tooxide may be used to etch the second FG layer 466. The second FG 466includes a protrusion 469 extending towards a CG 442 that has also beenformed in a third recess 459.

In FIG. 4H, a vertical string of memory cells 400 is shown having amemory cell with a control gate 442 disposed between tiers of dielectricmaterial 440 (oxide layers) a floating gate 466 between the tiers ofdielectric material 440, wherein the floating gate 466 includes aprotrusion 469 extending towards the control gate 442, and a chargeblocking structure (layers 448, 450, 456) between the floating gate 466and the control gate 442, wherein at least a portion of the chargeblocking structure (e.g., nitride layer 450 and/or second oxide layer456) wraps around the protrusion 469.

The charge blocking structure includes a first layer of oxide 448, alayer of nitride 450 and a second layer of oxide 456, and the chargeblocking structure (layers 448, 450, 456) includes a barrier structure(e.g., e.g., nitride layer 450 and/or second oxide layer 456) that wrapsaround the protrusion 469. A layer of the nitride 450 and portions ofthe second layer of oxide 456 are disposed between the protrusion 469and a dielectric material 440. The second layer of oxide 456 completelyseparates the layer of nitride 450 from the floating gate 466. Thefloating gate 466 is in contact with the second oxide layer 456 and isnot in contact with the nitride layer 450.

Floating gate portion 466 contacts a tier of the dielectric material440. Only protrusion 469 of floating gate 466 extends toward the controlgate 442. A barrier film of the charge blocking structure, e.g., atleast one of layers 448, 450, 456, has a substantially vertical portiondisposed between the control gate 442 and the floating gate 466 and afirst substantially horizontal portion laterally extending partiallybetween a tier of dielectric material 440 and a portion of floating gate466. The barrier film may be the nitride layer 450.

Protrusion 469 is separated from a tier of dielectric material 440 bythe second oxide layer 456, or by a horizontal portion of the barrierfilm 450 and the second oxide layer 456. The second layer of oxide 456include first and second substantially horizontal portions 457 and asubstantially vertical portion 459, wherein a thickness of thesubstantially vertical portion 459 of the second layer of oxide 456 andthe thickness of the horizontal portions 459 of the second layer ofoxide 456 are substantially the same. A first portion of the floatinggate 466 is separated from the first tier of dielectric material 440 bya substantially horizontal portion of the second layer of oxide 456.Another portion of the floating gate 466 is separated from the firsttier of dielectric material 440 by the substantially horizontal portionof the barrier film 450 and a first portion of the second layer of oxide456.

FIGS. 5A-H illustrate formation of a stack of materials 500 according toan embodiment. FIGS. 5A-H begin after deposition of the pillar oxide asshown in FIG. 2D. FIG. 5A is a cross-sectional view of a stack ofmaterials 500 including alternating tiers of dielectric material (e.g.,oxide layers 540) and control gate material (e.g., tiers of conductivematerials, such as doped polysilicon layers 542). In FIG. 5A, a chargeblocking structure is formed including a first oxide layer 548 formedsubstantially vertical over the recessed CG layer 542 and a second layer550 (e.g., a nitride layer), which in some embodiments comprises abarrier film) formed over the length of the full pillar 511. UnlikeFIGS. 2A-F and 3A, the second oxidation step is not performed afterdeposition of the pillar nitride 550. The second layer 550 (e.g., anitride layer) may be formed in each of the recesses 546 adjacent to thefirst oxide layer 548 and adjacent to exposed surfaces of the oxidelayers 540 in the openings.

FIG. 5B is a perspective view of a stacked cell 500 showing theformation of the alternating oxide layers 540, control gate layer 542,first recess 546, first oxide layer 548 and the nitride layer 550. Firstoxide layer 548 and the nitride layer 550 are formed (e.g., grown) tocreate a charge blocking structure. In FIGS. 5A and 5B, openings,include first recesses 546 adjacent to the doped polysilicon layers 542,have been formed extending therethrough. Bottom layer 544 may be an etchstop layer, such as AlO_(x).

FIG. 5C is a cross-sectional view of the stack of materials 500 after afirst floating gate (FG1) material (e.g., first polysilicon) is formedin the first recesses 546 shown in FIGS. 5A-B. For example, in at leastsome embodiments, the first polysilicon 560 may be deposited in theopenings and etched back to recess the first polysilicon in each of thefirst recesses 546, thereby forming first FG1s 560 with inner surfaces562. The inner surface 562 of the first FG layer 560 may be etched evenwith the inner surface 552 of the second layer 550 (e.g., nitridelayer). Alternatively, any disposable layer with appropriate goodconformal deposition may be used.

FIG. 5D is a cross-sectional view of the stack of materials 500 afteretching the first FG layer 560 to recess the inner surface 562 of thefirst FG/disposable layer 560 even with the inner surface 570 of thetiered oxide layer 540 and after etching the inner surface 552 of thesecond layer 550 (e.g., nitride layer) beyond the inner surface 570 ofthe tiered oxide layer 540. An etchant selective to polysilicon and anetchant selective to nitride may be used to etch the first FG/disposablelayer 560 and the nitride layer, respectively.

FIG. 5E is a cross-sectional view of the stack of materials 500 afterremoval of the FG/disposable layer 560 via etching, e.g., wet, dry orvapor etching. A second recess 558 is left between the nitride layer 550and the tier oxide layer 540.

FIG. 5F is a cross-sectional view of the stack of materials 500 afterforming a second oxidation layer 556 to complete the ONO layer. Theformation of the second oxidation layer 556 results in a third recess559.

FIG. 5G is a cross-sectional view of the stack of materials 500 afterdeposition of polysilicon over the length of the full pillar 511 and inthe third recess 559 for the second FG layer 566. The polysilicon forthe second FG layer 566 may optionally be doped.

FIG. 5H is a cross-sectional view of the stack of materials 500 afterisolating the second FG layer 566 by etching or oxidation until innersurface 568 of the second FG layer 566 is substantially even with theinner surface 570 of the tiered oxide layer 540. An etchant selective tooxide may be used to etch the second FG layer 566 even with the innersurface 570 of the tiered oxide layers 540. The second FG 566 includes aprotrusion 569 extending towards a CG 542 that has also been formed in athird recess 559.

In FIG. 5H, a vertical string of memory cells 500 is shown having amemory cell with a control gate 542 disposed between tiers of dielectricmaterial 540 (oxide layers) a floating gate 566 between the tiers ofdielectric material 540, wherein the floating gate 566 includes aprotrusion 569 extending towards the control gate 542, and a chargeblocking structure (layers 548, 550, 556) between the floating gate 566and the control gate 542, wherein at least a portion of the chargeblocking structure (e.g., nitride layer 550 and/or second oxide layer556) wraps around the protrusion 569.

The charge blocking structure includes a first layer of oxide 548, alayer of nitride 550 and a second layer of oxide 556, and the chargeblocking structure (layers 548, 550, 556) includes a barrier structure(e.g., e.g., nitride layer 550 and/or second oxide layer 556) that wrapsaround the protrusion 569. A layer of the nitride 550 and portions ofthe second layer of oxide 556 are disposed between the protrusion 569and a dielectric material 540. The second layer of oxide 556 completelyseparates the layer of nitride 550 from the floating gate 566. Thefloating gate 566 is in contact with the second oxide layer 556 and isnot in contact with the nitride layer 550.

Floating gate portion 566 contacts a tier of the dielectric material540. Only protrusion 569 of floating gate 566 extends toward the controlgate 542. A barrier film of the charge blocking structure, e.g., atleast one of layers 548, 550, 556, has a substantially vertical portiondisposed between the control gate 542 and the floating gate 566 and afirst substantially horizontal portion laterally extending partiallybetween a tier of dielectric material 540 and a portion of floating gate566. The barrier film may be the nitride layer 550.

Protrusion 569 is separated from a tier of dielectric material 540 bythe second oxide layer 556, or by a horizontal portion of the barrierfilm 550 and the second oxide layer 556. The second layer of oxide 556include first and second substantially horizontal portions 557 and asubstantially vertical portion 559, wherein a thickness of thesubstantially vertical portion 559 of the second layer of oxide 556 andthe thickness of the horizontal portions 559 of the second layer ofoxide 556 are substantially the same. A first portion of the floatinggate 566 is separated from the first tier of dielectric material 540 bya substantially horizontal portion of the second layer of oxide 556.Another portion of the floating gate 566 is separated from the firsttier of dielectric material 540 by the substantially horizontal portionof the barrier film 550 and a first portion of the second layer of oxide556.

The embodiments described above with reference to FIGS. 2A-P, FIGS.3A-D, FIGS. 4A-H, and FIGS. 5A-H, illustrate embodiments where, at leastrelative to a memory cell in the structure shown in FIG. 1, any topand/or bottom parasitic SONOS devices (relative to the memory cell) maybe pared back and the length of the FG is substantially doubled (and maynow be substantially equal to the length of the CG). The lengthened FGwill potentially provide more impact on modulating the NAND stringcurrent, e.g., due to the longer FG and the absence or minimization ofparasitic SONOS devices

A negative impact may include a reduction in the gate coupling ratio(CGR). In simulation, the GCR was reduced from 38% to 31.4%. However,this reduction may be decreased, i.e., the CGR increased, by increasingthe etchback of the dielectric layer to form sidewalls. The etchback ofthe dielectric may be increased from 50% of the dielectric to 75%. Thisreduction in GCR results in higher V_(g)V_(t) and V_(w)V_(t), whereV_(g) is the gate voltage, V_(t) is the threshold voltage, and Vw is thewriting voltage.

In at least some of the embodiments, FG area is increased significantlyand two potential parasitic SONOS devices, and the direct injection paththey provide for electrons moving from the CG to the channel, arereduced or eliminated. Increasing the FG length in the direction of NANDchannel may result in a higher degree of channel conductance modulation(e.g., a higher on/off ratio), noise reduction (e.g., a larger FG) andreliability gain due to replacement of the two SiN regions impactingNAND channel conductance with a larger FG (e.g., approximately two timeslonger in the channel length direction). Further, the structures reduceor eliminate two parasitic currents: the CG-AA (active area) and at theboundary of the FG and the interpoly dielectric (IPD) devices. Both maycause nitride trapping.

If diagonal FG-AA current occurs, which is current between the FG edgeto the LDD region, trapping is degraded. However, a thinner oxide underSiN might provide an undesirable tradeoff, because more SiN would be inthe FG to LDD current path, leading to additional SiN trapping. An edgeE-field increase due to SiN at the edge modulating fringe E-field mayincrease this parasitic current and is also undesirable.

The larger FG length in a recessed cell may reduce cell noise, such asforward-tunneling voltage (FTV) and reverse-tunneling voltage (RTV). Forexample, if GCR=CIPD/(CIPD+CTUNOX), where CTUNOX is the capacitanceacross a tunnel oxide layer and CIPD refers to the capacitance acrossthe control-dielectric or the IPD. The recessed cells may have a largerCTUNOX, and a larger CIPD. Since the CTUNOX increase is moresignificant, the GCR is reduced. This is a V_(t) window loss and aV_(pgm)/erase increase, where V_(pgm) is the program voltage. Theprogram voltage V_(pgm) is applied to a word line (WL) to program memorycells. Since capacitances increase, noise may be be smaller. The moreuniform E-field in the tiered oxide (TO) of the recessed cell mayprovide a reliability (cycling degradation) gain. Accordingly, the GCRloss and noise improvement can be configured to obtain a net gain withrespect to functionality and reliability.

FIGS. 6A-C illustrates three additional vertical NAND memories 602, 604,606 formed according to methods described herein below according tovarious embodiments. FIGS. 7A-F illustrate fabrication of a verticalmemory as shown in FIG. 6A according to an embodiment.

FIG. 7A is a cross-sectional view of a stack of materials 700 includingalternating tiers of dielectric material (e.g., oxide layers 740) andcontrol gate material (e.g., tiers of conductive materials, such asdoped polysilicon layers 742) to form a pillar 711. The CG layer 742 isetched to a predetermined depth to create a first recess area 746between the tiered oxide layers 740.

FIG. 7B is a cross-sectional view of the stack of materials 700 after acharge blocking structure is formed. In FIG. 7B, the charge blockingstructure includes a first oxide layer 748 formed substantially verticalover the recessed CG layer 742 and a second layer 750 (e.g., a nitridelayer), which in some embodiments comprises a barrier film) formed overthe length of the full pillar 711. The second layer 750 (e.g., a nitridelayer) may be formed in each of the recesses 746 adjacent to the firstoxide layer 748 and adjacent to exposed surfaces of the oxide layers 740in the openings. A second oxide layer 756 is formed substantiallyvertical over the second layer 750 (e.g., a nitride layer) to formsecond recess 758.

FIG. 7C is a cross-sectional view of the stack of materials 700 afterdeposition of polysilicon over the length of the full pillar 711 for aFG layer 760. The FG layer 760 fills the recess 758 (shown in FIG. 7B)between the tiered oxide layers 740 and over the horizontal portions ofthe nitride layer 754 and over the substantially vertical second oxidelayer 756. The FG layer 760 includes an inner surface 762. Thepolysilicon for the FG layer 760 may optionally be doped.

FIG. 7D is a cross-sectional view of the stack of materials 700 afterthe FG layer 760 (e.g., polysilicon) is made even with the inner surface752 of the second layer 750 (e.g., nitride layer). The FG layer 760 maybe made even with the inner surface 752 of the second layer 750 (e.g.,nitride layer) using an oxide decapping step followed with hotphosphoric acid etch.

FIG. 7E is a cross-sectional view of the stack of materials 700 afteretching the inner surface 752 of the second layer 750 (e.g., nitridelayer) beyond the inner surface 770 of the tiered oxide layer 740. Anetchant selective to polysilicon and an etchant selective to oxide maybe used to etch the nitride layer 750.

FIG. 7F is a cross-sectional view of the stack of materials 700 afterdeposition of a channel material 780. The channel material is conformalto the inner surface 770 of the nitride layer 750.

Accordingly, in FIG. 7F, floating gate 760 is separated from a tier ofdielectric material 740 by the horizontal portion of the barrier film,e.g., the nitride layer 750. A thickness of the substantially verticalportion 781 of the barrier film 750 is greater than a thickness of thesubstantially horizontal portions 783 of the barrier film 750.

FIG. 8 illustrates a vertical NAND cell 800 as shown in FIG. 6Baccording to an embodiment. FIG. 8 shows the vertical memory cell 802with the alternating layers of tiered oxide 840 and polysilicon tieredcontrol gate (CG) layers 842 to form a pillar 811. The CG layer 842 isetched to a predetermined depth to create a first recess area betweenthe tiered oxide layers 840. An oxide layer 848 and a nitride layer 850are formed over the recessed CG layer 842. A polysilicon floating gate(FG) layer 860 is formed in the recess between the horizontal portions849 of the nitride layer 850. A TuO_(x) layer or second oxide layer 890is formed over the FG layer 860. While the FG layer 860 is shownsubstantially circular, those skilled in the art will recognize that theFG layer may be rectangular as illustrated in at least FIGS. 7A-F. Theinner surface 852 of the second layer 850 (e.g., nitride layer) isetched beyond the inner surface 870 of the tiered oxide layer 840.

In FIG. 8, the second layer of oxide 890 completely separates the layerof nitride 850 from the floating gate 860. The floating gate 860 is incontact with the second oxide layer 890 and is not in contact with thenitride layer 850. A barrier film of the charge blocking structure,e.g., at least one of layers 848, 850, 890, has a substantially verticalportion 859 disposed between the control gate 842 and the floating gate860 and substantially horizontal portions 857 laterally extendingpartially between a tier of dielectric material 840 and a portion offloating gate 860. The barrier film may be the nitride layer 850. Thefloating gate 860 is separated from the first tier of dielectricmaterial 240 by the substantially horizontal portion 859 of the barrierfilm 250 and the second oxide layer 890.

FIGS. 9A-D illustrate fabrication of a vertical memory cell 606 as shownin FIG. 6C according to an embodiment. For the fabrication of thevertical memory cell 606 as shown in FIG. 6C, the initial processes aresimilar to those shown in FIGS. 7A-D.

FIG. 9A is a cross-sectional view of a stack of materials 900 includingalternating tiers of dielectric material (e.g., oxide layers 940) andcontrol gate material (e.g., tiers of conductive materials, such asdoped polysilicon layers 942). In FIG. 9A, a charge blocking structureis formed including a first oxide layer 948 formed substantiallyvertical over the recessed CG layer 942 and a second layer 950 (e.g., anitride layer), which in some embodiments comprises a barrier film)formed over the length of the full pillar 911. The second layer 950(e.g., a nitride layer) may be formed adjacent to the first oxide layer948. The second layer 950 may be formed by depositing the second layer950 along the full length of the pillar and then etching the secondlayer 950 to recess the inner surface 962 of the second layer 950 beyondthe inner surface 970 of the tiered oxide layer 940 forming recess 958.An etchant selective to oxide may be used to etch the second layer 950.

FIG. 9B is a cross-sectional view of the stack of materials 900 afterforming a second oxidation layer 956 to complete the ONO layer. Theformation of the second oxidation layer 956 results in a second recess959. A polysilicon layer is deposited over the length of the full pillar411 for the second FG layer 966. The polysilicon for the second FG layer966 may optionally be doped.

FIG. 9C is a cross-sectional view of the stack of materials 900 afterisolating the second FG layer 966 by etching or oxidation until innersurface 968 of the second FG layer 966 is substantially even with theinner surface 970 of the tiered oxide layer 940. An etchant selective tooxide may be used to etch the second FG layer 966 even with the innersurface 970 of the tiered oxide layers 940. The second FG 966 includes aprotrusion 969 extending towards a CG. FIG. 9D is a cross-sectional viewof the stack of materials 900 after deposition of a channel material980.

Thus, in FIG. 9D, a vertical string of memory cells 900 are shown havinga memory cell that includes a control gate 942 between tiers ofdielectric material 940 (oxide layers) a floating gate 966 between thetiers of dielectric material 940, wherein the floating gate 966 includesa protrusion 969 extending towards the control gate 942, and a chargeblocking structure (layers 948, 950, 956) between the floating gate 966and the control gate 942, wherein at least a portion of the chargeblocking structure (layers 948, 950, 956) wraps around the protrusion969.

The charge blocking structure includes a first layer of oxide 948, alayer of nitride 950 and a second layer of oxide 956, and the chargeblocking structure (layers 948, 950, 956) includes a barrier structure(e.g., the second layer of oxide 956 or the nitride layer 950) thatwraps around the protrusion 969. A layer of the nitride layer 950 andportions of the second layer of oxide 956 are disposed between theprotrusion 969 and dielectric material 940. The floating gate 966 is incontact with the layer of nitride 950 and the second layer of oxide 956.Near the inner surface 970, floating gate portion 966 contacts a tier ofthe dielectric material 940. Only protrusion 969 of floating gate 966extends toward the control gate 942. A length 971 of the floating gate966 between the tiers of dielectric material 940 is substantially equalto a length 943 of the control gate 942 between the tiers of dielectricmaterial 940.

A barrier film of the charge blocking structure, e.g., at least nitridelayer 950, has a substantially vertical portion 959 disposed between thecontrol gate 942 and the floating gate 966 and substantially horizontalportions 957 laterally extending partially between a tier of dielectricmaterial 940 and a portion of floating gate 966. The barrier film may bethe nitride layer 950. Protrusion 969 is separated from a tier ofdielectric material 940 by at least a horizontal portion of the barrierfilm 950 and the second oxide layer 956.

The second layer of oxide 956 includes first and second substantiallyhorizontal portions 987 and a substantially vertical portion 989,wherein a thickness of the substantially vertical portion 989 of thesecond layer of oxide 956 and the thickness of the horizontal portions987 of the second layer of oxide 956 are substantially the same. A firstportion of the floating gate 966 is separated from the first tier ofdielectric material 940 by a substantially horizontal portion 957 of thebarrier film 950 and the horizontal portion 987 of the second oxidelayer 987. A thickness 999 of the substantially vertical portion 959 ofthe barrier film 950 is greater than a thickness 997 of thesubstantially horizontal portions 957 of the barrier film 950.

FIGS. 10A-F illustrate fabrication of a vertical memory as shown in FIG.6C according to some embodiments. FIG. 10A is a cross-sectional view ofa stacked cell 1000 showing alternating layers of tiered oxide 1040 andpolysilicon tiered control gate (CG) layers 1042 to form a pillar 1011.The CG layer 1042 is etched to a predetermined depth to create a firstrecess area 1043 between the tiered oxide layers 1040.

FIG. 10B is a cross-sectional view of the stack of materials 1000 aftera charge blocking structure is formed. In FIG. 10B, the charge blockingstructure includes a first oxide layer 1048 formed substantiallyvertical over the recessed CG layer 1042 and a second layer 1050 (e.g.,a nitride layer), which in some embodiments comprises a barrier film)formed over the length of the full pillar 1011. However, in FIG. 10B,the second layer 1050 has angled edges that narrow as proceeding towardthe CG layer 1042. The second layer 1050 may be formed adjacent to thefirst oxide layer 1048 and adjacent to exposed surfaces of the oxidelayers 1040 in the openings. The second layer 1050 (e.g., a nitridelayer) forms recesses 1046

FIG. 10C is a cross-sectional view of the stack of materials 1000 afteretching the inner surface 1052 of the second layer 1050 (e.g., nitridelayer) beyond the inner surface 1070 of the tiered oxide layer 1040. Anetchant selective to oxide may be used to etch the nitride layer.

FIG. 10D is a cross-sectional view of the stack of materials 1000 afterforming a second oxidation layer 1056 over the second layer 1050 tocomplete the ONO layer. FIG. 10D also shows deposition of polysiliconover the length of the full pillar 1011 over the second oxidation layer1056 and the tiered oxide layers 1040 for the FG layer 1060. Thepolysilicon for the FG layer 1060 may optionally be doped.

FIG. 10E is a cross-sectional view of the stack of materials 1000 afterisolating the second FG layer 1060 by etching or oxidation until innersurface 1062 of the FG layer 1060 is substantially even with the innersurface 1070 of the tiered oxide layer 1040. An etchant selective tooxide may be used to etch the FG layer 1060 even with the inner surface1070 of the tiered oxide layers 1040. The FG 1060 includes a protrusion1069 extending towards a CG 1042.

FIG. 10D is a cross-sectional view of the stack of materials 1000 afterforming a TuOx layer 1090 over FG layer 1060. The TuOx layer 1090 may begrown over the FG layer 1060.

As a result of implementing the apparatus and methods described herein,greater density and more reliable memory operation may be achieved.Increased customer satisfaction may result.

Thus, in FIG. 10F, a vertical string of memory cells 1000 are shownhaving a memory cell that includes a control gate 1042 between tiers ofdielectric material 1040 (oxide layers) a floating gate 1060 between thetiers of dielectric material 1040, wherein the floating gate 1060includes a protrusion 1069 extending towards the control gate 1042, anda charge blocking structure (layers 1048, 1050, 1056) between thefloating gate 1060 and the control gate 1042, wherein at least a portionof the charge blocking structure, e.g., nitride layer 1050 and/or secondoxide layer 1056, at least partially wraps around the protrusion 1069.

The charge blocking structure includes a first layer of oxide 1048, alayer of nitride 1050 and a second layer of oxide 1056, and the chargeblocking structure (layers 1048, 1050, 1056) includes a barrierstructure (e.g., the second layer of oxide 1056 and/or the nitride layer1050) that at least partially wraps around the protrusion 1069. Portionsof the layer of the nitride layer 1050 and portions of the second layerof oxide 1056 are disposed between the protrusion 1069 and a dielectricmaterial 1040. The second layer of oxide 1056 completely separates thelayer of nitride 1050 from the floating gate 1060. The floating gate1060 is in contact with the second oxide layer 1056 and is not incontact with the nitride layer 1050.

Only protrusion 1069 of floating gate 1060 extends toward the controlgate 1042. A barrier film of the charge blocking structure, e.g., atleast one of layers 1050, 1056, has a substantially vertical portion1059 disposed between the control gate 1042 and the floating gate 1060and substantially horizontal portions 1057 laterally extending at leastpartially between a tier of dielectric material 1040 and a portion offloating gate 1060. The barrier film may be the nitride layer 1050.

Protrusion 1069 is separated from a tier of dielectric material 1040 byat least a horizontal portion of the barrier film 1050 and/or the secondoxide layer 1056. The second layer of oxide 1056 include substantiallyhorizontal portions 1087 and a substantially vertical portion 1089,wherein a thickness of the substantially vertical portion 1089 of thesecond layer of oxide 1056 and the thickness of the horizontal portions1087 of the second layer of oxide 1056 are substantially the same. Afirst portion of the floating gate 1060 is separated from the first tierof dielectric material 1040 by the substantially horizontal portions1087 of the second oxide layer 1056. Another portion of the floatinggate 1060 is separated from the first tier of dielectric material 1040by the substantially horizontal portions 1057 of the barrier film 1050and horizontal portions 1087 of the second layer of oxide 1056.

Such embodiments of the inventive subject matter may be referred toherein, individually and/or collectively, without intending tovoluntarily limit the scope of this application to any single concept ifmore than one is in fact disclosed. Thus, although specific embodimentshave been illustrated and described herein, any arrangement calculatedto achieve the same purpose may be substituted for the specificembodiments shown. This disclosure is intended to cover any and/or alladaptations or variations of various embodiments. Combinations of theabove embodiments, and other embodiments not specifically describedherein, will be apparent to those of skill in the art upon reviewing theabove description.

The term “horizontal” as used in this application is defined as a planeparallel to the plane or surface of a wafer or substrate, regardless ofthe actual orientation of the wafer or substrate. The term “vertical”refers to a direction perpendicular to the horizontal as defined above.Prepositions, such as “on”, “side”, “higher”, “lower”, “over” and“under” are defined with respect to the plane or surface being on thetop surface of the wafer or substrate, regardless of the actualorientation of the wafer or substrate. The terms “wafer” and “substrate”are used herein to refer generally to any structure on which integratedcircuits are formed, and also to such structures during various stagesof integrated circuit fabrication. The following detailed descriptionis, therefore, not to be taken in a limiting sense, and the scope of theembodiments is defined only by the appended claims, along with the fullscope of equivalents to which such claims are entitled.

A NAND array architecture is an array of memory cells arranged such thatthe memory cells of the array are coupled in logical rows to accesslines (which are coupled to, and in some cases are at least partiallyformed by, the CGs of the memory cells), which are referred to as wordlines. Some memory cells of the array are coupled together in series,source to drain, between a source line and the data line, which isreferred to as a bit line.

Memory cells in NAND array architecture can be programmed to apredetermined data state. For example, electric charge can beaccumulated (e.g., placed) on, or removed from, an FG of a memory cellto program the cell into one of a number of data states. For example, amemory cell referred to as a single level cell (SLC) can be programmedto a one of two data states, e.g., a “1” or a “0” state. Memory cellsreferred to as multilevel cells (MLCs) can be programmed to a one ofmore than two data states.

When electrons are stored on the FG, they modify the V_(t) of the cell.Thus, when the cell is “read” by placing a specific voltage on the CG(e.g., by driving the access line coupled to the cell with a readvoltage), electrical current will either flow or not flow between thecell's source and drain connections, depending on the Vt of the cell.This presence or absence of current can be sensed and translated into1's and 0's, reproducing the stored data.

Each memory cell may not directly couple to a source line and a dataline. Instead, the memory cells of an example array may be arrangedtogether in strings, typically of 8, 16, 32, or more strings each, wherethe memory cells in the string are coupled together in series, source todrain, between a common source line and a common data line.

A NAND architecture can be accessed by a row decoder activating a row ofmemory cells by driving the access line coupled to those cells with avoltage. In addition, the access lines coupled to the unselected memorycells of each string can be driven with a different voltage. Forexample, the unselected memory cells of each string can be driven with apass voltage so as to operate them as pass transistors, allowing them topass current in a manner that is unrestricted by their programmed datastates. Current can then flow from the source line to the data linethrough each floating gate memory cell of the series coupled string,restricted by the memory cell of each string that is selected to beread. This places the currently encoded, stored data values of the rowof selected memory cells on the column bit lines. A column page of datalines is selected and sensed, and then individual data words areselected from the sensed data words from the column page andcommunicated from the memory apparatus. The flash memory, such as a NANDarray, may be formed as a 3D memory with a stack of memory cells thatincludes floating gates (FGs), charge blocking structures (e.g., IPD),control gates (CGs), and tiers of dielectric material, (e.g., oxidelayers 108). In the illustrated example, IPD 104 is disposed betweeneach FG 102 and CG 106. A recess is formed adjacent to a CG for the IPDand a FG.

The Abstract of the Disclosure is provided to comply with 37 C.F.R.§1.72(b), requiring an abstract that will allow the reader to quicklyascertain the nature of the technical disclosure. It is submitted withthe understanding that it will not be used to interpret or limit thescope or meaning of the claims. In addition, in the foregoing DetailedDescription, it can be seen that various features are grouped togetherin a single embodiment for the purpose of streamlining the disclosure.This method of disclosure is not to be interpreted as reflecting anintention that the claimed embodiments require more features than areexpressly recited in each claim. Rather, as the following claimsreflect, subject matter of the embodiments lies in one or more featuresof a single disclosed embodiment. Thus the following claims are herebyincorporated into the Detailed Description, with each claim standing onits own as a separate embodiment.

What is claimed is:
 1. A memory cell, comprising: a control gate betweena first tier of dielectric material and a second tier of dielectricmaterial; a floating gate between the first tier of dielectric materialand the second tier of dielectric material, wherein the floating gateincludes a protrusion extending towards the control gate; and a chargeblocking structure between the floating gate and the control gate,wherein at least a portion of the charge blocking structure wraps aroundthe protrusion.
 2. The memory cell of claim 1, wherein the floating gatecontacts the first tier of dielectric material and the second tier ofdielectric material.
 3. The memory cell of claim 1, wherein theprotrusion is an only protrusion of the floating gate extending towardsthe control gate.
 4. The memory cell of claim 1, wherein a length of thefloating gate between the tiers of dielectric material is substantiallyequal to a length of the control gate between the tiers of dielectricmaterial.
 5. The memory cell of claim 1, wherein the charge blockingstructure comprises a first layer of oxide, a layer of nitride, and asecond layer of oxide; and wherein at least a portion of a barrierstructure of the charge blocking structure wraps around the protrusioncomprises the second layer of oxide.
 6. The memory cell of claim 5,wherein the floating gate is in contact with the layer of nitride andthe second layer of oxide.
 7. The memory cell of claim 5, wherein thesecond layer of oxide completely separates the layer of nitride from thefloating gate.
 8. The memory cell of claim 5, wherein the floating gateis in contact with the second layer of oxide and is not in contact withthe layer of nitride.
 9. The memory cell of claim 5, wherein a firstportion of the layer of nitride and a first portion of the second layerof oxide is between the protrusion and an upper surface of the firsttier of dielectric material, and wherein a second portion of the layerof nitride and a second portion of the second layer of oxide is betweenthe protrusion and a lower surface of the second tier of dielectricmaterial.
 10. The memory cell of claim 9, wherein the protrusioncomprises a middle protrusion, and the floating gate further comprises:a first protrusion adjacent to the upper surface of the first tier ofdielectric material; and a second protrusion adjacent to the lowersurface of the second tier of dielectric material, wherein the middleprotrusion is between the first and second protrusions, wherein thefirst portion of the second layer of oxide is between the firstprotrusion and the middle protrusions, and wherein the second portion ofthe second layer of oxide is between the second protrusion and themiddle protrusions.
 11. An apparatus including a vertical string ofmemory cells, wherein a memory cell of the vertical string of memorycells comprises: a control gate between a first tier of dielectricmaterial and a second tier of dielectric material; a floating gatebetween the first tier of dielectric material and the second tier ofdielectric material; and a charge blocking structure between thefloating gate and the control gate, wherein the charge blockingstructure comprises a barrier film, wherein a substantially verticalportion of the barrier film is between the control gate and the floatinggate, wherein a first substantially horizontal portion of the barrierfilm laterally extends partially between the first tier of dielectricmaterial and the floating gate, and wherein a second substantiallyhorizontal portion of the barrier film laterally extends partiallybetween the second tier of dielectric material and the floating gate.12. The apparatus of claim 11, wherein a first portion of the floatinggate is separated from an upper surface of the first tier of dielectricmaterial by the first substantially horizontal portion of the barrierfilm, and further wherein a second portion of the floating gate isseparated from a lower surface of the second tier of dielectric materialby the second substantially horizontal portion of the barrier film. 13.The apparatus of claim 11, wherein a thickness of the substantiallyvertical portion of the barrier film is greater than a thickness of thefirst substantially horizontal portion of the barrier film and isgreater than a thickness of the second substantially horizontal portionof the barrier film.
 14. The apparatus of claim 11, wherein a length ofthe floating gate between the tiers of dielectric material issubstantially equal to a length of the control gate between the tiers ofdielectric material.
 15. The apparatus of claim 11, wherein the barrierfilm comprises a layer of nitride.
 16. The apparatus of claim 11,wherein the charge blocking structure further comprises first and secondlayers of oxide.
 17. The apparatus of claim 16, wherein the barrier filmcomprises a layer of nitride.
 18. The apparatus of claim 16, wherein afirst portion of the floating gate is separated from an upper surface ofthe first tier of dielectric material by the first substantiallyhorizontal portion of the barrier film and a first portion of the secondlayer of oxide, and further wherein a second portion of the floatinggate is separated from a lower surface of the second tier of dielectricmaterial by the second substantially horizontal portion of the barrierfilm and a second portion of the second layer of oxide.
 19. Theapparatus of claim 18, wherein a third portion of the floating gate isseparated from the upper surface of the first tier of dielectricmaterial by a third portion of the second layer of oxide, and furtherwherein a fourth portion of the floating gate is separated from thelower surface of the second tier of dielectric material by a fourthportion of the second layer of oxide.
 20. The apparatus of claim 16,wherein the floating gate includes a protrusion extending towards thecontrol gate.
 21. The apparatus of claim 20, wherein the floating gatecontacts the first tier of dielectric material and the second tier ofdielectric material.
 22. The apparatus of claim 20, wherein theprotrusion is separated from an upper surface of the first tier ofdielectric material by at least the first substantially horizontalportion of the barrier film and a first portion of the second layer ofoxide, and further wherein the protrusion is separated from a lowersurface of the second tier of dielectric material by at least the secondsubstantially horizontal portion of the barrier film and a secondportion of the second layer of oxide.
 23. The apparatus of claim 22,wherein the first and second portions of the second layer of oxidecomprise first and second substantially horizontal portions of thesecond layer of oxide, wherein the second layer of oxide furthercomprises a substantially vertical portion, and wherein a thickness ofthe substantially vertical portion of the second layer of oxide, athickness of the first substantially horizontal portion of the secondlayer of oxide, and a thickness of the second substantially horizontalportion of the second layer of oxide are substantially the same.